Steve McGarvey, Author for History-Computer
As a Process Engineer in the Semiconductor manufacturing industry, I specialized in Critical Dimension Scanning Electron Microscopes and Photolithography. As a Defect Metrology Application Engineer, I specialized in technical marketing and client-facing support in relation to dark field non-patterned wafer surface scanning inspection systems, dark field patterned wafer inspection, defect review Scanning electron microscopes, bright field patterned wafer defect inspection and electron beam defect metrology. These days I'm writing and traveling the world.
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