What is a Burn-in Test for Electronic Devices?

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A burn-in test is a special type of procedure designed to detect early failures or malfunctions in electronic devices and allow manufacturers to correct them.

What is a Burn-In Test?

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This test can be performed either on the device as a whole or modularly — that is, on each electronic component of that device separately.

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Burn-in testing did not have any peculiar history or pioneers all its own but instead developed of a piece with the evolution of electronic devices themselves.

The Origins of the Burn-In Test

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Burn-in testing is important for detecting and preventing the occurrence of all types of early failures and malfunctions in the lifetimes of electronic components and devices.

What is the importance of burn-in testing?

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